Photoreflectance study of the GaAs buffer layer in InAs/GaAs quantum dots
نویسندگان
چکیده
منابع مشابه
Photoreflectance characterization of InAs/GaAs self-assembled quantum dots grown by ALMBE
We report on a photoreflectance investigation in the 0.8–1.5 eV photon energy range and at temperatures from 80 to 300 K on stacked layers of InAs/GaAs self-assembled quantum dots (QDs) grown by Atomic-Layer Molecular Beam Epitaxy. We observed clear and well-resolved structures, which we attribute to the optical response of different QD families. The dependence of the ground state transition en...
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ژورنال
عنوان ژورنال: Superficies y Vacío
سال: 2017
ISSN: 1665-3521
DOI: 10.47566/2017_syv30_1-040056